LIN, Chuan-Ju. Controlling Test Overlap Rate in Automated Assembly of Multiple Equivalent Test Forms. The Journal of Technology, Learning and Assessment, [S. l.], v. 8, n. 3, 2010. Disponível em: https://ejournals.bc.edu/index.php/jtla/article/view/1622. Acesso em: 2 may. 2024.