Skip to main content
Skip to main navigation menu
Skip to site footer
Open Menu
The Journal of Technology, Learning and Assessment
Current
Archives
About
About the Journal
Submissions
Editorial Team
Privacy Statement
Contact
Search
Login
Home
/
Archives
/
Vol. 8 No. 3 (2010)
Vol. 8 No. 3 (2010)
Controlling Test Overlap Rate in Automated Assembly of Multiple Equivalent Test Forms
Published:
2010-01-28
Articles
Controlling Test Overlap Rate in Automated Assembly of Multiple Equivalent Test Forms
Chuan-Ju Lin
PDF
Developed By
Open Journal Systems
Information
For Readers
For Authors
For Librarians
Part of the
PKP Publishing Services Network